SEM - Zeiss GeminiSEM 450 (Irchel)

The Zeiss GeminiSEM 450 is a field emission scanning electron microscope equipped with secondary, backscattered electron and EDX detectors. The system can be operated in variable pressure mode using N2 gas to reduce charging or image non-conductive specimens.

University Zurich, Irchel Campus, Room Y42-F-52. 

Follow this link to apply for an introduction to the microscope.

Electron column

Gemini Zeiss column with Schottky field emitter and double condensor system, which enables free selectable beam current without changing apertures

Acceleration voltage: 0.02 - 30 kV.

Probe current: 3pA - 40 nA
 

Detector Systems

InlensSE detector

Everhart-Thornley type SE detector in chamber.

4 quadrant + annular diode solid state BSE-detector

High efficiency variable pressure secondary electron detector (VPSE)

X-ray detector (X-MAX80, AZTec Advanced, Oxford)  for elemental analysis.

Accessories

Stage: 5-axis, full motorized stage

Navigation camera: Allows capturing images of samples before inserting to chamber and subsequent navigation based on camera image

Airlock system for fast sample exchange

System controls

Integrated SmartSEM user interface for standard applications

Oxford software on separate computer for EDX elemental analysis control.

Responsible Persons

If you have questions about the device please contact the responsible person.

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